The yield of good chips in multiprobe for a certain batch of wafers is 83%. The wafers have a\ndiameter of 150 mm with a processable area that is 140 m
The yield of good chips in multiprobe for a certain batch of wafers is 83%. The wafers have a
\r\ndiameter of 150 mm with a processable area that is 140 mm in diameter. If the defects are all
\r\nassumed to be point defects, determine the density of point defects using the Bose-Einstein method
\r\nof estimating yield.